New NSLS-II beamline illuminates electronic structures
(PHYSorg.com Physics)

On July 15, 2018, the Soft Inelastic X-ray Scattering (SIX) beamline at the National Synchrotron Light Source II (NSLS-II)-a U.S. Department of Energy (DOE) Office of Science User Facility at DOE`s Brookhaven National Laboratory-welcomed its first visiting researchers. SIX is an experimental station designed to measure the electronic properties of solid materials using ultrabright x-rays. The materials can be as small as a few microns-one millionth of a meter.