PhD defence by Christian Schou Oxvig: Algorithms for Reconstruction of Undersampled Atomic Force Microscopy images
(WorldNews Denmark)

22.06.2017 kl. 13.00 - 16.00 Title Algorithms for Reconstruction of Undersampled Atomic Force Microscopy images Abstract An atomic force microscope is capable of measuring the topography of a surface on a nano meter scale by moving a cantilever with a tiny tip at its end across the surface. The flexibility in the choice of the scan pattern, that the cantilever follows, allows for undersampling of the surface, i.e. measuring only a part of the surface. In order to display an image...