Researchers turn atomic force microscope measurements into color images
(PHYSorg.com Physics)

A French and Japanese research group has developed a new way of visualizing the atomic world by turning data scanned by an atomic force microscope into clear color images. The newly developed method, which enables observation of materials and substances like alloys, semiconductors, and chemical compounds in a relatively short time, holds promise of becoming widely used in the research and development of surfaces and devices.